Fig. 2From: An effective device to enable consistent scratches for in vitro scratch assaysScratch assay on HDF cell line. A Representative images of scratch profiles created by the scratch device (wounding tool and guide), 200 µL tip and 1000 µL tip. Black lines indicate sites where measurements were taken for analysis of scratch widths. B Scratch width measurements. Standard deviations were calculated from measurements across the scratch as shown in A. C Box and whisker plot indicating minimum, maximum, median, upper, and lower quartile values across the means of all wells. D Representative whole well image of scratches. Yellow lines go through the centre of the wellsBack to article page